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personal data approved: 2016. IV. 22.
Personal data
Ferenc Riesz
name Ferenc Riesz
year of birth 1965
name of institution
doctoral school
BME Doctoral School of Physics (Academic staff member)
Contact details
E-mail address rieszmfa.kfki.hu
phone number +36 1 392-2222/3156
own web page
Academic title
scientific degree, title Ph.D.
year degree was obtained 1994
discipline to which degree belongs electrical engineering
institution granting the degree MTA Tudományos Minősítő Bizottság (to be translated)
scientific degree, title CSc
year degree was obtained 1994
discipline to which degree belongs
institution granting the degree HAS
Employment
2015 - MTA Energiatudományi Kutatóközpont, Műszaki Fizikai és Anyagtudományi Intézet (research institute, not university)
other (not specified) (tudományos főmunkatárs)
Thesis topic supervisor
number of doctoral students supervised until now 1
number of students who fulfilled course requirements 1
students who obtained their degrees:
István Endre Lukács PhD 2006  DSP1-BME

  Thesis topic proposals
Research
research area physics and technology of semiconductors, optical metrology of flat surfaces, Makyoh topography
research field in which current research is conducted electrical engineering
physics
Publications
2013

Riesz F: Non-linearity and related features of Makyoh (magic-mirror) imaging, JOURNAL OF OPTICS 15: (7) 14 p. Paper 075709.
type of document: Journal paper/Article
impact factor: 2.010
language: English
DOI 
2011

Riesz F: General spectral properties of Makyoh imaging of quasi-periodic surfaces, OPTICS AND LASER TECHNOLOGY 43: (1) pp. 245-247.
type of document: Journal paper/Article
impact factor: 1.515
language: English
DOI 
2011

Riesz F: Sensitivity and detectability in Makyoh imaging, OPTIK 122: (11) pp. 1005-1009.
type of document: Journal paper/Article
impact factor: 0.510
language: English
DOI 
2011

Bosi M, Attolini G, Watts BE, Rossi F, Ferrari C, Riesz F, Jiang L: Wafer curvature analysis in 3C-SiC layers grown on (0 0 1) and (1 1 1) Si substrates, JOURNAL OF CRYSTAL GROWTH 318: (1) pp. 401-405.
type of document: Journal paper/Article
impact factor: 1.726
number of independent citations: 6
language: English
DOI 
2011

C Frigeri, M Serényi, N Q Khánh, A Csík, F Riesz, Z Erdélyi, L Nasi, D L Beke, H-G Boyen: Relationship between structural changes, hydrogen content and annealing in stacks of ultrathin Si/Ge amorphous layers, NANOSCALE RESEARCH LETTERS 6: (1) 6 p. Paper 189.
type of document: Journal paper/Article
impact factor: 2.726
number of independent citations: 3
language: English
DOI 
2000

Riesz F: Geometrical optical model of the image formation in Makyoh (magic-mirror) topography, JOURNAL OF PHYSICS D-APPLIED PHYSICS 33: (23) pp. 3033-3040.
type of document: Journal paper/Article
impact factor: 1.179
number of independent citations: 18
language: English
1996

Riesz F: Crystallographic tilting in high-misfit (100) semiconductor heteroepitaxial systems, JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY A-VACUUM SURFACES AND FILMS 14: (2) pp. 425-430.
type of document: Journal paper/Article
impact factor: 1.612
number of independent citations: 31
language: English
1996

Riesz F: Crystallographic tilting in lattice-mismatched heteroepitaxy: A Dodson-Tsao relaxation approach, JOURNAL OF APPLIED PHYSICS 79: (8) pp. 4111-4117.
type of document: Journal paper/Article
impact factor: 1.812
number of independent citations: 15
language: English
1993

Riesz F: The role of surface steps in the asymmetric surface dislocation nucleation in vicinal heterostructures with compressive and tensile stresses, SURFACE SCIENCE 292: (3) pp. L817-L820.
type of document: Journal paper/Article
impact factor: 2.639
number of independent citations: 8
language: English
1991

Riesz F, Lischka K, Rakennus K, Hakkarainen T, Pesek A: Tilting of lattice planes in InP epilayers grown on miscut GaAs substrates: the effect of initial growth conditions, JOURNAL OF CRYSTAL GROWTH 114: (1-2) pp. 127-132.
type of document: Journal paper/Article
impact factor: 1.551
number of independent citations: 17
language: English
Number of independent citations to these publications:98 
Scientometric data
list of publications and citations
number of scientific publications that meet accreditation criteria:
152
number of scientific publications:
167
monographs and professional books:
0
monographs/books in which chapters/sections were contributed:
1 
number of independent citations to scientific publications and creative works:
370
further relevant information regarding accreditation (in Hungarian)
Nemzetközi szabadalom: Lukács IE (23%), Makai JP (24%), Pfitzner L (5%), Riesz F (34%), Szentpáli B (14%) Apparatus and measurement procedure for the fast, quantitative, non-contact topographic investigation of semiconductor wafers and other mirror like surfaces European Patent EP 1 434 981 B1, July 5, 2006 US Patent 7,133,140 B2, November 7, 2006 (to be translated)

 
All rights reserved © 2007, Hungarian Doctoral Council. Doctoral Council registration number at commissioner for data protection: 02003/0001. Program version: 1.2318 ( 2016. XI. 26. )