 |
|
| Personal data sheet |
 Print previewpersonal data approved: 2024. II. 18. | Publications |
2022
 from data base, 2023. I. 05. |
Pálinkás András, Kálvin György, Vancsó Péter, Kandrai Konrád, Szendrő Márton, Németh Gergely, Németh Miklós, Pekker Áron, Pap József S., Petrik Péter, Kamarás Katalin, Tapasztó Levente, Nemes-Incze Péter: The composition and structure of the ubiquitous hydrocarbon contamination on van der Waals materials, NATURE COMMUNICATIONS 13: (1) 6770
type of document: Journal paper/Article
number of independent citations: 1
language: English
URL |
2022
from data base, 2023. I. 05. |
Budai Judit, Pápa Zsuzsanna, Petrik Péter, Dombi Péter: Ultrasensitive probing of plasmonic hot electron occupancies, NATURE COMMUNICATIONS 13: (1) 6695
type of document: Journal paper/Article
language: English
URL |
2022
from data base, 2023. I. 05. |
Dobrik G, Nemes-Incze P, Majerus B, Süle P, Vancsó P, Piszter G, Menyhárd M, Kalas B, Petrik P, Henrard L, Tapasztó L: Large-area nanoengineering of graphene corrugations hosting visible-frequency graphene plasmons, NATURE NANOTECHNOLOGY 17: (1) pp. 61-66.
type of document: Journal paper/Article
number of independent citations: 7
language: English
URL |
2021
from data base, 2023. I. 05. |
Romanenko Alekszej, Kalas Benjamin, Hermann Petra, Hakkel Orsolya, Illés Levente, Fried Miklós, Fürjes Peter, Gyulai Gergö, Petrik Peter: Membrane-Based In Situ Mid-Infrared Spectroscopic Ellipsometry: A Study on the Membrane Affinity of Polylactide-co-glycolide Nanoparticulate Systems, ANALYTICAL CHEMISTRY 93: (2) pp. 981-991.
type of document: Journal paper/Article
number of independent citations: 2
language: English
URL |
2020
from data base, 2023. I. 05. |
Kalas B, Zolnai Z, Safran G, Serenyi M, Agocs E, Lohner T, Nemeth A, Khanh NQ, Fried M, Petrik P: Micro-combinatorial sampling of the optical properties of hydrogenated amorphous Si (1-x) Ge (x) for the entire range of compositions towards a database for optoelectronics, SCIENTIFIC REPORTS 10: (1) 19266
type of document: Journal paper/Article
number of independent citations: 6
language: English
URL |
2001
from data base, 2023. I. 05. |
Vazsonyi E, Szilagyi E, Petrik P, Horvath ZE, Lohner T, Fried M, Jalsovszky G: Porous silicon formation by stain etching, THIN SOLID FILMS 388: (1-2) pp. 295-302.
type of document: Journal paper/Article
number of independent citations: 127
language: English
URL |
2000
from data base, 2023. I. 05. |
Petrik P, Lohner T, Fried M, Biro LP, Khanh N Q, Gyulai J, Lehnert W, Schneider C, Ryssel H: Ellipsometric study of polycrystalline silicon films prepared by low-pressure chemical vapor deposition, JOURNAL OF APPLIED PHYSICS 87: (4) pp. 1734-1742.
type of document: Journal paper/Article
number of independent citations: 49
language: English
URL |
1998
from data base, 2023. I. 05. |
Petrik P, Biro LP, Fried M, Lohner T, Berger R, Schneider C, Gyulai J, Ryssel H: Comparative study of surface roughness measured on polysilicon using spectroscopic ellipsometry and atomic force microscopy, THIN SOLID FILMS 315: (1-2) pp. 186-191.
type of document: Journal paper/Article
number of independent citations: 100
language: English
URL |
1998
from data base, 2023. I. 05. |
Petrik P, Fried M, Lohner T, Berger R, Biro LP, Schneider C, Gyulai J, Ryssel H: Comparative study of polysilicon-on-oxide using spectroscopic ellipsometry, atomic force microscopy, and transmission electron microscopy, THIN SOLID FILMS 313-314: pp. 259-263.
type of document: Journal paper/Article
number of independent citations: 39
language: English
URL |
1996
from data base, 2023. I. 05. |
Fried M, Lohner T, Polgar O, Petrik P, Vazsonyi E, Barsony I, Piel JP, Stehle JL: Characterization of different porous silicon structures by spectroscopic ellipsometry, THIN SOLID FILMS 276: (1-2) pp. 223-227.
type of document: Journal paper/Konferenciaközlemény
number of independent citations: 49
language: English
URL |
| | Number of independent citations to these publications: | 380 |
|
|
|
|
|
Login
