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personal data approved: 2016. III. 05.
Personal data
Péter Petrik
name Péter Petrik
year of birth 1970
name of institution
doctoral school
BME Doctoral School of Physics (Announcer of research topic)
BME George A. Olah Doctoral School of Chemistry and Chemical Technology (Academic staff member)
ELTE Doctoral School of Physics (Announcer of research topic)
PE Chemical Engineering and Material Science Doctoral School (Academic staff member)
PE Doctoral School of Molecular- and Nanotechnologies (Announcer of research topic)
PTE Doctoral School of Physics (Academic staff member)
the share of work in the different doctoral schools. BME Doctoral School of Physics 15%
ELTE Doctoral School of Physics 15%
PE Doctoral School of Molecular- and Nanotechnologies 30%
PTE Doctoral School of Physics 40%
accreditation statement submitted to: Pannon University, Veszprém
Contact details
E-mail address petrikmfa.kfki.hu
phone number +36 1 392-2502
own web page
Academic title
scientific degree, title Ph.D.
year degree was obtained 2000
discipline to which degree belongs physics
institution granting the degree Technical University of Budapest
Employment
1996 - MTA-Műszaki Fizikai és Anyagtudományi Kutatóintézet (research institute, not university)
other (not specified) (Tud. Főmunkatárs)
Thesis topic supervisor
number of doctoral students supervised until now 4
number of students who fulfilled course requirements 2
students who obtained their degrees:
Emil Agócs PhD 2015  DSMN
(50%) Péter Dániel Kozma PhD 2011  DSMN

students with degree granting in process:
(50%) Judit Nádor PhD (2018/08)  DSMN
  Thesis topic proposals
Research
research area spectroscopic ellipsometry, materials science
research field in which current research is conducted material sciences
physics
Publications
2015

Bin Anooz S, Petrik P, Schmidbauer M, Remmele T, Schwarzkopf J: Refractive index and interband transitions in strain modified NaNbO<inf>3</inf> thin films grown by MOCVD, JOURNAL OF PHYSICS D-APPLIED PHYSICS 48: (38) 9 p. Paper 385303.
type of document: Journal paper/Article
language: English
URL 
2013

Holfelder I, Beckhoff B, Fliegauf R, Honicke P, Nutsch A, Petrik P, Roeder G, Weser J: Complementary methodologies for thin film characterization in one tool - a novel instrument for 450 mm wafers, JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY 28: (4) pp. 549-557.
type of document: Journal paper/Article
number of independent citations: 2
language: English
URL 
2013

P Petrik, B Pollakowski, S Zakel, T Gumprecht, B Beckhoff, M Lemberger, Z Labadi, Z Baji, M Jank, A Nutsch: Characterization of ZnO structures by optical and X-ray methods, APPLIED SURFACE SCIENCE 281: pp. 123-128.
type of document: Journal paper/Article
number of independent citations: 1
language: English
URL 
2013

P Petrik, T Gumprechte, A Nutscha, G Roedera, M Lemberger, G Juhasz, O Polgar, C Major, P Kozma, M Janosov, B Fodor, E Agocs, M Fried: Comparative measurements on atomic layer deposited Al2O3 thin films using ex situ table top and mapping ellipsometry, as well as X-ray and VUV reflectometry, THIN SOLID FILMS 541: pp. 131-135.
type of document: Journal paper/Article
number of independent citations: 1
language: English
URL 
2011

Gyulai G, Pénzes CsB, Mohai M, Lohner T, Petrik P, Kurunczi S, Kiss É: Interfacial properties of hydrophilized poly(lactic-co-glycolic acid) layers with various thicknesses, JOURNAL OF COLLOID AND INTERFACE SCIENCE 362: (2) pp. 600-606.
type of document: Journal paper/Article
number of independent citations: 5
language: English
DOI 
2001

Vazsonyi E, Szilagyi E, Petrik P, Horvath ZE, Lohner T, Fried M, Jalsovszky G: Porous silicon formation by stain etching, THIN SOLID FILMS 388: (1-2) pp. 295-302.
type of document: Journal paper/Article
number of independent citations: 78
language: English
DOI 
2000

Petrik P, Lohner T, Fried M, Biro LP, Khanh N Q, Gyulai J, Lehnert W, Schneider C, Ryssel H: Ellipsometric study of polycrystalline silicon films prepared by low-pressure chemical vapor deposition, JOURNAL OF APPLIED PHYSICS 87: (4) pp. 1734-1742.
type of document: Journal paper/Article
number of independent citations: 41
language: English
DOI 
1998

Petrik P, Biro LP, Fried M, Lohner T, Berger R, Schneider C, Gyulai J, Ryssel H: Comparative study of surface roughness measured on polysilicon using spectroscopic ellipsometry and atomic force microscopy, THIN SOLID FILMS 315: (1-2) pp. 186-191.
type of document: Journal paper/Article
number of independent citations: 66
language: English
DOI 
1998

Petrik P, Fried M, Lohner T, Berger R, Biro LP, Schneider C, Gyulai J, Ryssel H: Comparative study of polysilicon-on-oxide using spectroscopic ellipsometry, atomic force microscopy, and transmission electron microscopy, THIN SOLID FILMS 313-314: pp. 259-263.
type of document: Journal paper/Article
number of independent citations: 37
language: English
DOI 
1996

Fried M, Lohner T, Polgar O, Petrik P, Vazsonyi E, Barsony I, Piel JP, Stehle JL: Characterization of different porous silicon structures by spectroscopic ellipsometry, THIN SOLID FILMS 276: (1-2) pp. 223-227.
type of document: Journal paper/Article
number of independent citations: 34
language: English
DOI 
Number of independent citations to these publications:265 
Scientometric data
list of publications and citations
number of scientific publications that meet accreditation criteria:
161
number of scientific publications:
166
monographs and professional books:
0
monographs/books in which chapters/sections were contributed:
3 
scientific publications published abroad that meet the accreditation criteria:
147
publications not in Hungarian, published in Hungary, meeting the accreditation criteria:
8
number of independent citations to scientific publications and creative works:
676

 
All rights reserved © 2007, Hungarian Doctoral Council. Doctoral Council registration number at commissioner for data protection: 02003/0001. Program version: 1.2318 ( 2016. XI. 26. )