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personal data approved: 2016. XII. 04.
Personal data
Miklós Fried
name Miklós Fried
year of birth 1958
name of institution
doctoral school
BME Doctoral School of Physics (Academic staff member)
BME George A. Olah Doctoral School of Chemistry and Chemical Technology (Academic staff member)
PE Chemical Engineering and Material Science Doctoral School (Academic staff member)
PE Doctoral School of Molecular- and Nanotechnologies (Core member)
Council of the Doctoral School (external member)
the share of work in the different doctoral schools. BME Doctoral School of Physics 18%
BME George A. Olah Doctoral School of Chemistry and Chemical Technology 20%
PE Doctoral School of Molecular- and Nanotechnologies 61%
PE DSMN Council of the Doctoral School (external member) 1%
accreditation statement submitted to: Pannon University, Veszprém
HAC accreditation Doktori iskola újra értékelésére vár
Contact details
E-mail address friedmfa.kfki.hu
phone number +36 20 549-2414
own web page
Academic title
scientific degree, title Ph.D.
year degree was obtained 1985
discipline to which degree belongs physics
institution granting the degree HAS
scientific degree, title DSc
year degree was obtained 2005
discipline to which degree belongs physics
institution granting the degree HAS
Employment
1982 - MTA EK Műszaki Fizikai és Anyagtudományi Kutatóintézet
scientific consultant
Thesis topic supervisor
number of doctoral students supervised until now 3
number of students who fulfilled course requirements 3
students who obtained their degrees:
Csaba Ferenc Major PhD 2010  DSP1-BME
Olivér Polgár PhD 1999  
(50%) László Rédei PhD 1998  

  Thesis topic proposals
Research
research area solid-state physics, ellipsometry, thin films, ion implantation, nano-crystalline semiconductors, size-effects on optical properties, optical properties of biological materials
research field in which current research is conducted material sciences
physics
Publications
2016

Fodor B, Kozma P, Burger S, Fried M, Petrik P: Effective medium approximation of ellipsometric response from random surface roughness simulated by finite-element method, THIN SOLID FILMS in press: p. in press. 5 p.
type of document: Journal paper/Article
language: English
URL 
2016

Judit Nador, Benjamin Kalas, Andras Saftics, Emil Agocs, Peter Kozma, Laszlo Korosi, Inna Szekacs, Miklos Fried, Robert Horvath, Peter Petrik: Plasmon-enhanced two-channel in situ Kretschmann ellipsometry of protein adsorption, cellular adhesion and polyelectrolyte deposition on titania nanostructures, OPTICS EXPRESS 24: (5) pp. 4812-4823.
type of document: Journal paper/Article
language: English
URL 
2016

Agocs Emil, Kozma Peter, Nador Judit, Hamori Andras, Janosov Milan, Kalas Benjamin, Kurunczi Sandor, Fodor Balint, Ehrentreich-Förster Eva, Fried Miklos, Horvath Robert, Petrik Peter: Grating coupled optical waveguide interferometry combined with in situ spectroscopic ellipsometry to monitor surface processes in aqueous solutions, APPLIED SURFACE SCIENCE in press: p. in press. 6 p.
type of document: Journal paper/Article
language: English
URL 
2014

Ambalanath Shan, M Fried, G Juhasz, C Major, O Polgar, A Nemeth, P Petrik, Lila R Dahal, Jie Chen, Zhiquan Huang, N J Podraza, R W Collins: High-Speed Imaging/Mapping Spectroscopic Ellipsometry for In-Line Analysis of Roll-to-Roll Thin Film Photovoltaics, IEEE JOURNAL OF PHOTOVOLTAICS 4: (1) pp. 355-361. pp. 355-361.
type of document: Journal paper/Article
number of independent citations: 8
language: English
DOI 
2014

Miklos Fried: On-line monitoring of solar cell module production by ellipsometry technique, THIN SOLID FILMS 571: (P3) pp. 345-355.
type of document: Journal paper/Article
number of independent citations: 1
language: English
DOI 
2009

Major C, Nemeth A, Radnoczi G, Czigany Z, Fried M, Labadi Z, Barsony I: Optical and electrical characterization of aluminium doped ZnO layers, APPLIED SURFACE SCIENCE 255: (21) pp. 8907-8912.
type of document: Journal paper/Article
number of independent citations: 27
language: English
DOI 
1998

Petrik P, Biro LP, Fried M, Lohner T, Berger R, Schneider C, Gyulai J, Ryssel H: Comparative study of surface roughness measured on polysilicon using spectroscopic ellipsometry and atomic force microscopy, THIN SOLID FILMS 315: (1-2) pp. 186-191.
type of document: Journal paper/Article
number of independent citations: 68
language: English
DOI 
1997

Krotkus A, Grigoras K, Pacebutas V, Barsony I, Vazsonyi E, Fried M, Szlufcik J, Nijs J, Levy Clement C: Efficiency improvement by porous silicon coating of multicrystalline solar cells, SOLAR ENERGY MATERIALS AND SOLAR CELLS 45: (3) pp. 267-273.
type of document: Journal paper/Article
number of independent citations: 55
language: English
DOI 
1992

FRIED M, LOHNER T, AARNINK WAM, HANEKAMP LJ, VANSILFHOUT A: DETERMINATION OF COMPLEX DIELECTRIC FUNCTIONS OF ION-IMPLANTED AND IMPLANTED-ANNEALED AMORPHOUS-SILICON BY SPECTROSCOPIC ELLIPSOMETRY, JOURNAL OF APPLIED PHYSICS 71: (10) pp. 5260-5262.
type of document: Journal paper/Article
number of independent citations: 77
language: English
DOI 
1992

FRIED M, LOHNER T, AARNINK WAM, HANEKAMP LJ, VANSILFHOUT A: NONDESTRUCTIVE DETERMINATION OF DAMAGE DEPTH PROFILES IN ION-IMPLANTED SEMICONDUCTORS BY SPECTROSCOPIC ELLIPSOMETRY USING DIFFERENT OPTICAL-MODELS, JOURNAL OF APPLIED PHYSICS 71: (6) pp. 2835-2843.
type of document: Journal paper/Article
number of independent citations: 59
language: English
DOI 
Number of independent citations to these publications:295 
Scientometric data
list of publications and citations
number of scientific publications that meet accreditation criteria:
194
number of scientific publications:
210
monographs and professional books:
0
monographs/books in which chapters/sections were contributed:
3 
scientific publications published abroad that meet the accreditation criteria:
174
publications not in Hungarian, published in Hungary, meeting the accreditation criteria:
16
number of independent citations to scientific publications and creative works:
1356

 
All rights reserved © 2007, Hungarian Doctoral Council. Doctoral Council registration number at commissioner for data protection: 02003/0001. Program version: 1.2318 ( 2016. XI. 26. )