Tivadar Lohner - ODT Personal data sheet


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Personal data sheet

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VALIDITY EXPIRED
personal data approved: 2018. II. 09.

Personal data

name	Tivadar Lohner
name of institution	Budapest University of Technology and Economics
doctoral school	BME Doctoral School of Physics (Academic staff member Az oktató a doktori iskola doktoranduszai számára oktat tantárgyat, és/vagy a doktori iskola megszavazta, hogy doktoranduszok számára kutatási témát írjon ki. )
the share of work in the different doctoral schools.	BME Doctoral School of Physics 100%

Contact details
E-mail address	lohnermfa.kfki.hu
phone number	+36 1 392-2695
	own web page

Academic title
scientific degree, title	CSc
year degree was obtained	1996
discipline to which degree belongs	physics
institution granting the degree	HAS
scientific degree, title	DSc
year degree was obtained	2013
discipline to which degree belongs	physics
institution granting the degree	HAS

Employment
1972 -	MTA Energiatudományi Kutatóközpont Műszaki Fizikai és Anyagtudományi Intézet (research institute, not university) other (not specified) (Tudományos tanácsadó)

Thesis topic supervisor

number of doctoral students supervised until now

number of students who fulfilled course requirements

students who obtained their degrees:

	Zsolt Zolnai	PhD	2006	DSP1-BME
	Ramadan Shaaban Essam	PhD	2004

Research
research area	Investigation of thin films and near-surface layers using spectroscopic ellipsometry and ion beam analytical methods
research field in which current research is conducted	physics

Publications

2016

M Serényi, T Lohner, G Sáfrán, J Szívós: Comparison in formation, optical properties and applicability of DC magnetron and RF sputtered aluminum oxide films, VACUUM 128: pp. 213-218.
type of document: Journal paper/Article
language: English
URL

2014

Lohner T, Agócs E, Petrik P, Zolnai Z, Szilágyi E, Kovács I, Szőkefalvi-Nagy Z, Tóth L, Tóth AL, Illés L, Bársony I: Spectroellipsometric and ion beam analytical studies on a glazed ceramic object with metallic lustre decoration, THIN SOLID FILMS 571: (3) pp. 715-719.
type of document: Journal paper/Article
language: English
Full text

2014

Tivadar Lohner, K. Jagadeesh Kumar, Péter Petrik, Aryasomayajula Subrahmanyam, István Bársony: Optical analysis of room temperature magnetron sputtered ITO films by reflectometry and spectroscopic ellipsometry, JOURNAL OF MATERIALS RESEARCH 29: (14) pp. 1528-1536.
type of document: Journal paper/Article
number of independent citations: 1
language: English
URL

2014

János Szívós, M Serényi, E Gergely-Fülöp, T Lohner, G Sáfrán: Nanopattern formation in UV laser treated a-AlOx and nc-Al/AlOx layers, VACUUM 109: pp. 200-205.
type of document: Journal paper/Article
language: English
URL

2013

T Lohner, P Csíkvári, P Petrik, G Hárs: Spectroellipsometric characterization of nanocrystalline diamond layers, APPLIED SURFACE SCIENCE 281: pp. 113-117.
type of document: Journal paper/Article
number of independent citations: 2
language: English
URL

2008

Szilagyi E, Petrik P, Lohner T, Koos AA, Fried M, Battistig G: Oxidation of SiC investigated by ellipsometry and Rutherford backscattering spectrometry, JOURNAL OF APPLIED PHYSICS 104: (1) Paper 014903. 7 p.
type of document: Journal paper/Article
number of independent citations: 18
language: English
DOI

2007

Serenyi M, Lohner T, Petrik P, Frigeri C: Comparative analysis of amorphous silicon and silicon nitride multilayer by spectroscopic ellipsometry and transmission electron microscopy, THIN SOLID FILMS 515: (7-8) pp. 3559-3562.
type of document: Journal paper/Article
number of independent citations: 22
language: English
URL

2001

Vazsonyi E, Szilagyi E, Petrik P, Horvath ZE, Lohner T, Fried M, Jalsovszky G: Porous silicon formation by stain etching, THIN SOLID FILMS 388: (1-2) pp. 295-302.
type of document: Journal paper/Article
number of independent citations: 97
language: English
DOI

2000

Lohner T, Fried M, Petrik P, Polgar O, Gyulai J, Lehnert W: Ellipsometric characterization of oxidized porous silicon layer structures, MATERIALS SCIENCE AND ENGINEERING B - SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY 69: (SI) pp. 182-187.
type of document: Journal paper/Article
number of independent citations: 29
language: English
DOI

1992

FRIED M, LOHNER T, AARNINK WAM, HANEKAMP LJ, VANSILFHOUT A: DETERMINATION OF COMPLEX DIELECTRIC FUNCTIONS OF ION-IMPLANTED AND IMPLANTED-ANNEALED AMORPHOUS-SILICON BY SPECTROSCOPIC ELLIPSOMETRY, JOURNAL OF APPLIED PHYSICS 71: (10) pp. 5260-5262.
type of document: Journal paper/Article
number of independent citations: 77
language: English
DOI

Number of independent citations to these publications:

246

Scientometric data

list of publications and citations

number of scientific publications that meet accreditation criteria:

228

number of scientific publications:

259

monographs and professional books:

monographs/books in which chapters/sections were contributed:

number of independent citations to scientific publications and creative works:

1624

2024. IV. 17.
ODT ülés
Az ODT következő ülésére 2024. június 14-én, pénteken 10.00 órakor kerül sor a Semmelweis Egyetem Szenátusi termében (Bp. Üllői út 26. I. emelet).