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personal data approved: 2016. IV. 28.
Personal data
Tivadar Lohner
name Tivadar Lohner
year of birth 1947
name of institution
doctoral school
BME Doctoral School of Physics (Academic staff member)
Contact details
E-mail address lohnermfa.kfki.hu
phone number +36 1 392-2695
own web page
Academic title
scientific degree, title CSc
year degree was obtained 1996
discipline to which degree belongs physics
institution granting the degree HAS
scientific degree, title DSc
year degree was obtained 2013
discipline to which degree belongs physics
institution granting the degree HAS
Employment
1972 - MTA Energiatudományi Kutatóközpont Műszaki Fizikai és Anyagtudományi Intézet (research institute, not university)
other (not specified) (Tudományos tanácsadó)
Thesis topic supervisor
number of doctoral students supervised until now 4
number of students who fulfilled course requirements 4
students who obtained their degrees:
Zsolt Zolnai PhD 2006  DSP1-BME
Ramadan Shaaban Essam PhD 2004  

Research
research area Investigation of thin films and near-surface layers using spectroscopic ellipsometry and ion beam analytical methods
research field in which current research is conducted physics
Publications
2016

M Serényi, T Lohner, G Sáfrán, J Szívós: Comparison in formation, optical properties and applicability of DC magnetron and RF sputtered aluminum oxide films, VACUUM 128: pp. 213-218.
type of document: Journal paper/Article
language: English
URL 
2014

Lohner T, Agócs E, Petrik P, Zolnai Z, Szilágyi E, Kovács I, Szőkefalvi-Nagy Z, Tóth L, Tóth AL, Illés L, Bársony I: Spectroellipsometric and ion beam analytical studies on a glazed ceramic object with metallic lustre decoration, THIN SOLID FILMS 571: (3) pp. 715-719.
type of document: Journal paper/Article
language: English
Full text 
2014

Tivadar Lohner, K. Jagadeesh Kumar, Péter Petrik, Aryasomayajula Subrahmanyam, István Bársony: Optical analysis of room temperature magnetron sputtered ITO films by reflectometry and spectroscopic ellipsometry, JOURNAL OF MATERIALS RESEARCH 29: (14) pp. 1528-1536.
type of document: Journal paper/Article
number of independent citations: 1
language: English
URL 
2014

János Szívós, M Serényi, E Gergely-Fülöp, T Lohner, G Sáfrán: Nanopattern formation in UV laser treated a-AlOx and nc-Al/AlOx layers, VACUUM 109: pp. 200-205.
type of document: Journal paper/Article
language: English
URL 
2013

T Lohner, P Csíkvári, P Petrik, G Hárs: Spectroellipsometric characterization of nanocrystalline diamond layers, APPLIED SURFACE SCIENCE 281: pp. 113-117.
type of document: Journal paper/Article
number of independent citations: 2
language: English
URL 
2008

Szilagyi E, Petrik P, Lohner T, Koos AA, Fried M, Battistig G: Oxidation of SiC investigated by ellipsometry and Rutherford backscattering spectrometry, JOURNAL OF APPLIED PHYSICS 104: (1) Paper 014903. 7 p.
type of document: Journal paper/Article
number of independent citations: 18
language: English
DOI 
2007

Serenyi M, Lohner T, Petrik P, Frigeri C: Comparative analysis of amorphous silicon and silicon nitride multilayer by spectroscopic ellipsometry and transmission electron microscopy, THIN SOLID FILMS 515: (7-8) pp. 3559-3562.
type of document: Journal paper/Article
number of independent citations: 21
language: English
URL 
2001

Vazsonyi E, Szilagyi E, Petrik P, Horvath ZE, Lohner T, Fried M, Jalsovszky G: Porous silicon formation by stain etching, THIN SOLID FILMS 388: (1-2) pp. 295-302.
type of document: Journal paper/Article
number of independent citations: 86
language: English
DOI 
2000

Lohner T, Fried M, Petrik P, Polgar O, Gyulai J, Lehnert W: Ellipsometric characterization of oxidized porous silicon layer structures, MATERIALS SCIENCE AND ENGINEERING B - SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY 69: (SI) pp. 182-187.
type of document: Journal paper/Article
number of independent citations: 28
language: English
DOI 
1992

FRIED M, LOHNER T, AARNINK WAM, HANEKAMP LJ, VANSILFHOUT A: DETERMINATION OF COMPLEX DIELECTRIC FUNCTIONS OF ION-IMPLANTED AND IMPLANTED-ANNEALED AMORPHOUS-SILICON BY SPECTROSCOPIC ELLIPSOMETRY, JOURNAL OF APPLIED PHYSICS 71: (10) pp. 5260-5262.
type of document: Journal paper/Article
number of independent citations: 77
language: English
DOI 
Number of independent citations to these publications:233 
Scientometric data
list of publications and citations
number of scientific publications that meet accreditation criteria:
222
number of scientific publications:
260
monographs and professional books:
0
monographs/books in which chapters/sections were contributed:
2 
number of independent citations to scientific publications and creative works:
1488

 
All rights reserved © 2007, Hungarian Doctoral Council. Doctoral Council registration number at commissioner for data protection: 02003/0001. Program version: 1.2318 ( 2016. XI. 26. )